Identification of a threshold value for the DEMATEL method using the maximum mean de-entropy algorithm to find critical services provided by a semiconductor intellectual property mall

By Chung-Wei Li, Gwo-Hshiung Tzeng. Expert systems with applications, 2009

317 citations recorded by the source corpus.

Subfields: Management of Technology and Innovation, Safety, Risk, Reliability and Quality, Strategy and Management

View Paper: https://www.semanticscholar.org/paper/730e976ac4235b66e2a37d7cd479276cec4c41c3