In Situ Mn K-edge X-ray Absorption Spectroscopy Studies of Electrodeposited Manganese Oxide Films for Electrochemical Capacitors
By K. Nam, M. Kim, K. Kim. 2007
199 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials
View Paper: https://www.semanticscholar.org/paper/72dbf76a16d29266e43de71d142416b30da3eb86
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In Electrical and Electronic Engineering
In Electronic, Optical and Magnetic Materials
Citations in the corpus
- Enhanced reversible divalent zinc storage in a structurally stable α-MnO2 nanorod electrode (2015, background): “0 Å are associated with characteristic Mn-Mnedge (edge-shared) and Mn-Mncorner (cornershared) shells [35].”
- Addressing the Achilles' heel of pseudocapacitive materials: Long‐term stability (2020, methodology): “This discrepancy was explained by Nam et al who utilized Mn K-edge X-ray near-edge absorption spectroscopy and concluded that the irreversible reduction of MnO2 proceeded not only near its surface but also in bulk.(61) Additionally, Ataherian et al systematically investigated the interplays among th”