Pixel-wise Deep Learning for Contour Detection

By Jyh-Jing Hwang, Tyng-Luh Liu. 2015

110 citations recorded by the source corpus.

We address the problem of contour detection via per-pixel classifications of edge point. To facilitate the process, the proposed approach leverages with DenseNet, an efficient implementation of multiscale convolutional neural networks (CNNs), to extract an informative feature vector for each pixel and uses an SVM classifier to accomplish contour detection. In the experiment of contour detection, we look into the effectiveness of combining per-pixel features from different CNN layers and verify their performance on BSDS500.

Subfields: Computer Vision and Pattern Recognition, Industrial and Manufacturing Engineering

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The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Computer Vision and Pattern Recognition

  1. Luc Van Gool
  2. Ming-Hsuan Yang
  3. Alan L. Yuille
  4. Dacheng Tao
  5. Xiaogang Wang
  6. Jitendra Malik
  7. Bernt Schiele
  8. Chunhua Shen

In Industrial and Manufacturing Engineering

  1. Alan L. Yuille
  2. Iasonas Kokkinos
  3. Zhuowen Tu
  4. Liang-Chieh Chen
  5. Xiang Bai
  6. Bjoern Andres
  7. Kevin P. Murphy
  8. Haibin Ling

Citations in the corpus