ToF-SIMS : surface analysis by mass spectrometry

By J. Vickerman, D. Briggs. 2001

563 citations recorded by the source corpus.

View Paper: https://www.semanticscholar.org/paper/7066c1d3f8a6bfa628280f9cb3d02c5663332726

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. K. Scheckel
2. E. Lombi
3. I. Kempson
4. Ron M. A. Heeren
5. Liam A. McDonnell

Citations in the corpus

• In situ analysis of metal(loid)s in plants: State of the art and artefacts (2011, background): “Its theory and general application are described in detail elsewhere (Vickerman and Briggs, 2001).”
• Imaging mass spectrometry. (2007, methodology): “Likewise, the impact of ToF analyzers on SIMS is readily identified in the widespread use of the term ToF–SIMS, which refers to methodologies for performing static SIMS and dynamic SIMS using ToF analyzers (Vickerman & Briggs, 2001).”