Reliability model for Al wire bonds subjected to heel crack failures

By S. Ramminger, N. Seliger, G. Wachutka. 2000

144 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/704751b2752b3fc6e4b8b2a6b875cc2d188c8069