Quantum metrology.

By Vittorio Giovannetti, Seth Lloyd, Lorenzo Maccone. Physical Review Letters, 2005

1,999 citations recorded by the source corpus.

We point out a general framework that encompasses most cases in which quantum effects enable an increase in precision when estimating a parameter (quantum metrology). The typical quantum precision enhancement is of the order of the square root of the number of times the system is sampled. We prove that this is optimal, and we point out the different strategies (classical and quantum) that permit one to attain this bound.

Subfields: Artificial Intelligence, Atomic and Molecular Physics, and Optics

View Paper: https://www.semanticscholar.org/paper/702e79eac0e0c0052ee9c4e28ea194876e07ade1

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In Artificial Intelligence

  1. Ivan H. Deutsch
  2. Roman Schnabel
  3. Steve Campbell
  4. Kaushik Parasuram Seshadreesan
  5. Mehul Malik
  6. Nathanan Tantivasadakarn
  7. Ashvin Vishwanath
  8. A. del Campo

In Atomic and Molecular Physics, and Optics

  1. Sebastian Deffner
  2. Steve Campbell
  3. Ivan H. Deutsch
  4. Roman Schnabel
  5. R. Verresen
  6. Ryan Thorngren
  7. Kaushik Parasuram Seshadreesan
  8. Christopher Jarzynski

Citations in the corpus