Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation

By A. Korsunsky, M. Sebastiani, E. Bemporad. 2010

186 citations recorded by the source corpus.

Subfields: Biomedical Engineering, Mechanical Engineering, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/6f419b485fa9ec811d70485d1f4d62c96e3c266f

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Mechanical Engineering

1. S. Feih
2. Jun Wei
3. Chen-Nan Sun

In Mechanics of Materials

1. S. Feih
2. Jun Wei

Citations in the corpus

• Advances in additive manufacturing process simulation: Residual stresses and distortion predictions in complex metallic components (2020, methodology): “In order to obtain quantitative comparisons at such localized regions, a microscale residual stresses measurement technique had to be employed, in this case the Focused Ion Beam (FIB) slitting + Digital Image Correlation (DIC) imaging method [32,33].”