Bulk and metastable defects in CuIn1−xGaxSe2 thin films using drive-level capacitance profiling

By J. Heath, J. D. Cohen, W. Shafarman. 2004

482 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/6f0c50001cc9e952f1805f51b2ca126bdf4eddca

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The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

  1. Clas Persson
  2. S. Lany
  3. M. Igalson
  4. S. Siebentritt
  5. M. Gloeckler

In Electrical and Electronic Engineering

  1. S. Siebentritt
  2. Clas Persson
  3. S. Lany
  4. M. Igalson
  5. M. Gloeckler
  6. S. Abermann

In Materials Chemistry

  1. S. Siebentritt
  2. Clas Persson
  3. S. Lany
  4. M. Igalson
  5. M. Gloeckler
  6. V. de Zea Bermudez
  7. S. Abermann

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