X-ray diffraction analysis of the defect structure in epitaxial GaN

By H. Heinke, V. Kirchner, S. Einfeldt, D. Hommel. 2000

304 citations recorded by the source corpus.

Subfields: Biomedical Engineering, Condensed Matter Physics, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/6e5cde03feacda748d9e5bc225a54f27fb6f543c