Photonic approach to making a material with a negative index of refraction

By G. Shvets. 2003

147 citations recorded by the source corpus.

Subfields: Aerospace Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

View Paper: https://www.semanticscholar.org/paper/6cf5ece3539af78f69910c5ba17bf3c5c17ad329

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In Aerospace Engineering

In Atomic and Molecular Physics, and Optics

In Electronic, Optical and Magnetic Materials

Citations in the corpus

On the cloaking effects associated with anomalous localized resonance (2006, background): “…oscillations in front of the lens as shown by Podolskiy et al. (2005) and these fields are the ones responsible for cloaking (see also Rao & Ong (2003), Shvets (2003), Merlin (2004) and Guenneau et al. (2005)) whose investigations provided some evidence of large fields in front of the lens).”
Optical nanotransmission lines: synthesis of planar left-handed metamaterials in the infrared and visible regimes (2006, methodology): “In this case, the parallel currents tend to distribute more widely in the space surrounding the structure, and as a result a valid definition of the effective parameters requires an integration over the space, which may be given following Shvets [15] as: 0 0 0 0 0 yodd eff y x yodd eff z E dy E dy E”
A proof of superlensing in the quasistatic regime, and limitations of superlenses in this regime due to anomalous localized resonance (2005, background): “Also, numerical results of Shvets (2003) for a slab of thickness dZ0.”
Tunable Phonon Polaritons in Atomically Thin van der Waals Crystals of Boron Nitride (2014, unknown): “The phonon polaritons are collective modes that originate from coupling of photons with optical phonons (10) in polar crystals that have been investigated in the context of energy transfer (11, 12), coherent control of the lattice (13), ultra-microscopy (14, 15), “superlensing” (16) and metamaterial”
Manipulating light with strongly modulated photonic crystals (2010, background): “In the infrared regime, SiC exhibits negative refraction with allowable loss [232, 233], which is due to strong dispersion.”