Correlation of contact resistance with microstructure for Au/Ni/Al/Ti/AlGaN/GaN ohmic contacts using transmission electron microscopy

By A. Bright, P. Thomas, M. Weyland, D. Tricker, Colin J. Humphreys, R. Davies. 2001

160 citations recorded by the source corpus.

Subfields: Condensed Matter Physics, Electrical and Electronic Engineering, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/6c4c3c431da52497bb7751599435e83aae3d7cd4