Revealing trap depth distributions in persistent phosphors

By K. V. D. Eeckhout, A. Bos, Dirk Poelman, Philippe F. Smet. 2013

362 citations recorded by the source corpus.

Subfields: Materials Chemistry, Radiation

View Paper: https://www.semanticscholar.org/paper/6c41196ed175f9f540446c69fde5754ebcd73b6f