X-ray diffraction measurement of residual stress in PZT thin films prepared by pulsed laser deposition

By Xuejun Zheng, Jiangyu Li, Yichun Zhou. 2004

160 citations recorded by the source corpus.

Subfields: Biomedical Engineering, Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/6c2c6b19df4c1faac67689476fa9b4a2975f1d37