Whole-profile structure solution from powder diffraction data using simulated annealing
By A. Coelho. 2000
359 citations recorded by the source corpus.
Subfields: Electronic, Optical and Magnetic Materials, Materials Chemistry, Physical and Theoretical Chemistry
View Paper: https://www.semanticscholar.org/paper/6b556a8f2064cd1192a1f26dd1ba8ded192be274
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In Electronic, Optical and Magnetic Materials
In Materials Chemistry
In Physical and Theoretical Chemistry
Citations in the corpus
- X-Cell: a novel indexing algorithm for routine tasks and difficult cases (2003, background): “…solution (Engel et al., 1999; Neumann, Leusen et al., 2002; Stephenson, 2000; Harris et al., 1994; David et al., 1998; Andreev et al., 1997; Coelho, 2000; Putz et al., 1999), indexing has emerged as a new important bottleneck for crystal structure determination from powder diffraction data.”
- A bound constrained conjugate gradient solution method as applied to crystallographic refinement problems (2005, background): “The overall increase in performance is of significance with respect to structure solution by simulated annealing as described by Coelho (2000).”