Optical properties of Al-doped ZnO thin films by ellipsometry

By Q. Li, D. Zhu, Wenjun Liu, Yi Liu, Xi-Ao Ma. 2008

145 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/6a5ccc1f1fdb35360050567984cc59a27c17268e