Dielectric constant measurement of thin films by differential time-domain spectroscopy
By Zhiping Jiang, Ming Li, X. Zhang. 2000
142 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Spectroscopy
View Paper: https://www.semanticscholar.org/paper/687f486bd589eb855d6ef06443f1d7f4651b1b88
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In Electrical and Electronic Engineering
In Spectroscopy
Citations in the corpus
- Materials for terahertz science and technology (2002, background): “An important focus is on the measurement of the dielectric constant of thin film”