PCA-based feature selection scheme for machine defect classification

By Arnaz Malhi, Robert X. Gao. IEEE Transactions on Instrumentation and Measurement, 2004

562 citations recorded by the source corpus.

Subfields: Analytical Chemistry, Control and Systems Engineering, Industrial and Manufacturing Engineering

View Paper: https://www.semanticscholar.org/paper/682343b02d255a24576195d9f587c12d7c05b4b4

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Analytical Chemistry

  1. Dhiraj Neupane
  2. Qingbo He
  3. Noureddine Zerhouni
  4. Jong-Hoon Seok
  5. Shen Zhang
  6. Said Rechak
  7. Tarak Benkedjouh
  8. Jianbo Yu

In Control and Systems Engineering

  1. Noureddine Zerhouni
  2. Kamal Medjaher
  3. Shen Zhang
  4. Bingnan Wang
  5. Shibo Zhang
  6. Thomas G. Habetler
  7. Qingbo He
  8. Xiaoxi Ding

In Industrial and Manufacturing Engineering

  1. Ruqiang Yan
  2. Rui Zhao
  3. Dhiraj Neupane
  4. Qingbo He
  5. Noureddine Zerhouni
  6. Jong-Hoon Seok
  7. Shen Zhang
  8. Said Rechak

Citations in the corpus