The Thickogram: a method for easy film thickness measurement in XPS

By P. Cumpson. 2000

166 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Radiation, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/663e438401a16cf5ae5fcfb284e3bc9fb6076101