Thickness dependent dielectric strength of a low-permittivity dielectric film

By H. K. Kim, F. G. Shi. 2001

141 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/65f577afe99e3253e7e3f38054ce9ea49b16a636

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1. S. Zelmat
2. S. Diaham
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4. M. Decup
5. M. Locatelli
6. S. Dinculescu

Citations in the corpus

• Dielectric breakdown of polyimide films: Area, thickness and temperature dependence (2010, background): “Figure 10), it seems that the scale parameter α obeys to the following thickness extrapolation law [36, 37]:”