Electron Microscopy and Analysis

By K. Knowles. 2001

260 citations recorded by the source corpus.

Subfields: Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/64db3d28c8470a55f480f475be3fc6feab39c7f3

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. Stéphane Roux
2. François Hild
3. J. Réthoré
4. Bing Pan
5. Hugo Leclerc
6. F. Mathieu
7. John-Eric Dufour
8. M. Ciccotti

Citations in the corpus

• Digital image correlation and fracture: an advanced technique for estimating stress intensity factors of 2D and 3D cracks (2009, background): “Applications to electronic microscopy or atomic force microscopy images have provided with the years amazing examples of their capabilities [1, 2].”