Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
By S. Findlay, N. Shibata, H. Sawada, E. Okunishi, Y. Kondo, T. Yamamoto, Y. Ikuhara. 2009
344 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Structural Biology, Surfaces, Coatings and Films
View Paper: https://www.semanticscholar.org/paper/6075e45e6595a7be981ef7e7926ac2c0870a793c
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In Atomic and Molecular Physics, and Optics
Citations in the corpus
- Towards Oxide Electronics: a Roadmap (2019, background): “16 (c)), as long as imaging artefacts are carefully accounted for [263].”
- Dr. Probe: A software for high-resolution STEM image simulation. (2018, background): “The very intuitive STEM modes of recording high-angle annular dark-field (HAADF) images providing Z-contrast [3] and the imaging of light atoms with annular bright-field (ABF) detectors [4] have attracted many labs world-wide to install and use aberration corrected STEM instruments.”