Texture, residual stress and structural analysis of thin films using a combined X-ray analysis

By Luca Lutterotti, Daniel Chateigner, S. Ferrari, J. Ricote. 2004

428 citations recorded by the source corpus.

Subfields: Materials Chemistry, Radiation

View Paper: https://www.semanticscholar.org/paper/5e6f765c87701d39f4058b097c10350dde61bd9a

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Materials Chemistry

1. Roman Vasin
2. H. Wenk
3. Luca Lutterotti

In Radiation

1. Roman Vasin
2. H. Wenk
3. Luca Lutterotti

Citations in the corpus

• Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis (2014, methodology): “…of polycrystals, they are also essential for crystal structure refinements (e.g. Lutterotti and Bortolotti, 2005; Grässlin et al., 2013), quantitative phase analysis of aggregates with preferred orientations, as well as the analysis of macroscopic stress states (e.g. Lutterotti et al., 2004).”