Atom Probe Tomography of Electronic Materials

By T. Kelly, D. Larson, K. Thompson, R. Alvis, J. Bunton, J. D. Olson, B. Gorman. 2007

218 citations recorded by the source corpus.

Subfields: Biomedical Engineering, Mechanics of Materials, Metals and Alloys

View Paper: https://www.semanticscholar.org/paper/5bf4b46b5fbc7b586d2c4680f1edfb3475b9e534

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Biomedical Engineering

1. Baptiste Gault
2. F. Geuser
3. Simon P. Ringer
4. Michael Moody
5. T. Prosa
6. R. Kolli
7. B. C. Muddle
8. L. Stephenson

In Mechanics of Materials

1. R. Kolli
2. A. Devaraj
3. Simon P. Ringer
4. Baptiste Gault

In Metals and Alloys

1. F. Geuser
2. Baptiste Gault
3. Simon P. Ringer
4. R. Kolli

Citations in the corpus

• Three-dimensional nanoscale characterisation of materials by atom probe tomography (2018, background): “Initial reports on laser-assisted APT of semiconductors dealt with Si, alumina, and SiC as well as III–V semiconductors, such as InAs and InP [188].”
• Estimation of the Reconstruction Parameters for Atom Probe Tomography (2008, background): “tations of laser pulsing is now facilitating a broader impact on materials scienceresearch , e.g. in the field of semiconductors science and technology (Thomson et al., 2007), as recently reviewed by Kelly et al. (2007). The accurate reconstruction of the atomic structure and chemistry in materials ”