RHEED Intensity Oscillations for the Stoichiometric Growth of SrTiO3 Thin Films by Reactive Molecular Beam Epitaxy

By J. Haeni, C. Theis, Darrell Schlom. 2000

175 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/5ba6cbe16cec16253793ef373a8639f9e04d9d6e

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Darrell Schlom
2. Long-qing Chen
3. John Robertson

In Electronic, Optical and Magnetic Materials

1. Darrell Schlom
2. Long-qing Chen
3. A. Tagantsev
4. S. Streiffer
5. Ingo Steinbach
6. Ramamoorthy Ramesh

In Materials Chemistry

1. Long-qing Chen
2. Darrell Schlom
3. Yulan Li
4. S. Choudhury
5. A. Tagantsev
6. S. Streiffer
7. Ingo Steinbach
8. John Robertson

Citations in the corpus

• Room-temperature ferroelectricity in strained SrTiO3 (2004, background): “Reflection high-energy electron diffraction (RHEED) intensity oscillations were monitored to ensure that complete SrO and TiO 2 monolayers were deposited alternately to form the SrTiO 3 film”