Self-Supervised Feature Learning by Learning to Spot Artifacts

By Simon Jenni, Paolo Favaro. 2018

133 citations recorded by the source corpus.

We introduce a novel self-supervised learning method based on adversarial training. Our objective is to train a discriminator network to distinguish real images from images with synthetic artifacts, and then to extract features from its intermediate layers that can be transferred to other data domains and tasks. To generate images with artifacts, we pre-train a high-capacity autoencoder and then we use a damage and repair strategy: First, we freeze the autoencoder and damage the output of the encoder by randomly dropping its entries. Second, we augment the decoder with a repair network, and train it in an adversarial manner against the discriminator. The repair network helps generate more realistic images by inpainting the dropped feature entries. To make the discriminator focus on the artifacts, we also make it predict what entries in the feature were dropped. We demonstrate experimentally that features learned by creating and spotting artifacts achieve state of the art performance in several benchmarks.

Subfields: Artificial Intelligence, Computer Vision and Pattern Recognition, Representation & Self-Supervised Learning

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Artificial Intelligence

  1. Dacheng Tao
  2. Ishan Misra
  3. Jiashi Feng
  4. Luc Van Gool
  5. Armand Joulin
  6. Trevor Darrell
  7. Quoc V. Le
  8. Andrea Vedaldi

In Computer Vision and Pattern Recognition

  1. Luc Van Gool
  2. Dacheng Tao
  3. Andrea Vedaldi
  4. Trevor Darrell
  5. Ming-Hsuan Yang
  6. Jiashi Feng
  7. Xiaogang Wang
  8. Jitendra Malik

In Representation & Self-Supervised Learning

  1. Ishan Misra
  2. Armand Joulin
  3. Piotr Bojanowski
  4. Mathilde Caron
  5. Dacheng Tao
  6. Andrea Vedaldi
  7. Saining Xie
  8. Jiashi Feng

Citations in the corpus