Far-field high-energy diffraction microscopy: a tool for intergranular orientation and strain analysis
By J. Bernier, Nathan R. Barton, Ulrich Lienert, Matthew P. Miller. 2011
227 citations recorded by the source corpus.
Subfields: Materials Chemistry, Mechanical Engineering
View Paper: https://www.semanticscholar.org/paper/5adfa11718228eb642ad83611e3881fcd861c96e
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In Materials Chemistry
In Mechanical Engineering
Citations in the corpus
- An introduction to three-dimensional X-ray diffraction microscopy (2012, methodology): “45, 1084–1097 Henning Friis Poulsen Three-dimensional X-ray diffraction microscopy 1087 et al., 2009; Bernier et al., 2011; Schmidt, 2012).”