Nucleation of dislocations and their dynamics in layered oxide cathode materials during battery charging
By A. Singer, Minghao Zhang, S. Hy, D. Cela, C. Fang, T. Wynn, B. Qiu, Y. Xia, Zhaoping Liu, A. Ulvestad and 9 more. Nature Energy, 2017
372 citations recorded by the source corpus.
Lithium-rich layered oxides (LRLO) are among the leading candidates for the next-generation cathode material for energy storage, delivering 50% excess capacity over commercially used compounds. Despite excellent prospects, voltage fade has prevented effective use of the excess capacity, and a major challenge has been a lack of understanding of the mechanisms underpinning the voltage fade. Here, using operando three-dimensional Bragg coherent diffractive imaging, we directly observe the nucleation of a mobile dislocation network in LRLO nanoparticles. The dislocations form more readily in LRLO as compared with a classical layered oxide, suggesting a link between the defects and voltage fade. We show microscopically how the formation of partial dislocations contributes to the voltage fade. The insights allow us to design and demonstrate an effective method to recover the original high-voltage functionality. Our findings reveal that the voltage fade in LRLO is reversible and call for new paradigms for improved design of oxygen-redox active materials.Voltage fade is a major obstacle for the efficient use of lithium-rich layered oxide materials in batteries. Here, the authors reveal the link between voltage fade and nucleation of a mobile dislocation network in the oxide nanoparticles, offering design ideas to restore the voltage.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/5ad2d5b4a218b244d60a62c68133b55882e5a400
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In Electrical and Electronic Engineering
Citations in the corpus
- Voltage Decay in Layered Li-Rich Mn-Based Cathode Materials (2019, methodology): “[83] used in situ Bragg coherent diffractive imaging to observe dislocation nucleation during high-voltage charging (Fig.”