The mechanism of defect creation and passivation at the SiC/SiO2 interface

By P. Deák, J. Knaup, T. Hornos, Christoph Thill, Á. Gali, T. Frauenheim. 2007

148 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/589ece283f5d2b5efcf6987b90ac169edcf3e0bf