Scaling of stack effect and its application for leakage reduction

By S. Narendra, V. De, D. Antoniadis, Anantha P. Chandrakasan, Shekhar Y. Borkar. ISLPED'01: Proceedings of the 2001 International Symposium on Low Power Electronics and Design (IEEE Cat. No.01TH8581), 2001

432 citations recorded by the source corpus.

Subfields: Artificial Intelligence, Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/5856c07e009d1a16bcbca89c5a9be0d692e59831