VAT: a tool for visual assessment of (cluster) tendency

By James C. Bezdek, Richard J. Hathaway. Proceedings of the 2002 International Joint Conference on Neural Networks. IJCNN'02 (Cat. No.02CH37290), 2002

359 citations recorded by the source corpus.

Subfields: Applied Mathematics, Computer Vision and Pattern Recognition, Management Science and Operations Research

View Paper: https://www.semanticscholar.org/paper/582093b45b8715524a552e78c09afdcc24f2ad62