An in Situ Study of Mesostructured CTAB−Silica Film Formation during Dip Coating Using Time-Resolved SAXS and Interferometry Measurements

By D. Grosso, F. Babonneau, P. Albouy, H. Amenitsch, A. Balkenende, A. Brunet-bruneau, J. Rivory. 2002

164 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Materials Chemistry, Spectroscopy

View Paper: https://www.semanticscholar.org/paper/576bde5c1beaaf83a6dae6c305fd89e6b4e50703