High resolution optical frequency domain reflectometry for characterization of components and assemblies.

By B. Soller, D. Gifford, M. Wolfe, M. Froggatt. Optics Express, 2005

696 citations recorded by the source corpus.

We describe a technique for polarization sensitive optical frequency domain reflectometry (OFDR) that achieves 22 micrometer two-point spatial resolution over 35 meters of optical length with -97 dB sensitivity in a single measurement taking only seconds. We demonstrate OFDR's versatility in both time- and frequency-domain metrology by analyzing a fiber Bragg grating (FBG) in both the spectral and impulse response domains. We also demonstrate how a polarization diversity receiver can be used in an OFDR system to track changes in the polarization state of light propagating through a birefringent component.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/56922df0a839c380cda3d776d32f1b337f063a8f

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In Electrical and Electronic Engineering

  1. Raffaella Di Sante
  2. Xiaoyi Bao
  3. Liang Chen
  4. Fumihiko Ito
  5. Yusuke Koshikiya
  6. Xinyu Fan
  7. Christophe Caucheteur
  8. Bruno Silva

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