Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology

By P. Schlossmacher, Dmitri O. Klenov, B. Freitag, H. Harrach. Microscopy Today, 2010

138 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Structural Biology, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/55071cf3e41212c1af9fdf19e1c9bfc7b560ec00