Robust optical delay lines with topological protection

By M. Hafezi, E. Demler, Mikhail D. Lukin, Jacob M. Taylor. 2011

1,290 citations recorded by the source corpus.

The robustness of edge states against external influence is a phenomenon that has been successfully applied to electron transport. A study now predicts that the same concept can also lead to improved optical devices. Topological protection might, for example, reduce the deleterious influence of disorder on coupled-resonator optical waveguides.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/55049fe2481e039895f2a6f695cf35ed48d79984

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In Atomic and Molecular Physics, and Optics

  1. Nathan Goldman
  2. Yuri Kivshar
  3. Franco Nori
  4. M. Rechtsman
  5. Luis E. F. Foa Torres
  6. A. Amo
  7. Alexander B. Khanikaev
  8. T. Ozawa

In Electrical and Electronic Engineering

  1. Yuri Kivshar
  2. Luis E. F. Foa Torres
  3. Shanhui Fan
  4. Marin Soljačić
  5. Alexander B. Khanikaev
  6. John D. Joannopoulos
  7. Ling Lu
  8. M. Rechtsman

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