Predicting the number of fatal soft errors in Los Alamos national laboratory's ASC Q supercomputer

By Sarah E. Michalak, Kevin W. Harris, N. Hengartner, B. Takala, S. Wender. IEEE transactions on device and materials reliability, 2005

183 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Software

View Paper: https://www.semanticscholar.org/paper/53f56ea2b295ae635f30883b5e17e29755afc83e

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  1. Bronis R. de Supinski
  2. A. Moody
  3. G. Bronevetsky
  4. K. Mohror

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