The probing depth of total electron yield in the sub-keV range: TEY-XAS and X-PEEM

By B. Frazer, B. Gilbert, B. R. Sonderegger, G. D. Stasio. 2003

198 citations recorded by the source corpus.

Subfields: Radiation, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/5368d06aaf700723a9dc06517cc38b148d703341

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1. M. Nicholls
2. M. Kasrai
3. G. Bancroft
4. P. Norton

Citations in the corpus

• Review ofthe lubrication ofmetallic surf aces by zinc dialkyl-dithiophosphates (2005, methodology): “X-PEEM is essentially spatially resolving XANES analysis which probes the topmost 2–5 nm of the film [146,151].”