TLP calibration, correlation, standards, and new techniques

By J. Barth, K. Verhaege, Leo G. Henry, J. Richner. 2001

211 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/534a7bc442eca79a3c86cda701e6c6f7f1ffee40

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. H. Feng
2. Guang Chen
3. Qiong Wu
4. Albert Z. Wang
5. Zhihua Wang
6. Haolu Xie
7. Chun Zhang
8. X. Guan

Citations in the corpus

• A review on RF ESD protection design (2005, methodology): “, dSCR1-3), designed in different processes were measured by a TLP tester with varying pulse rise time, from 200 ps to 20 ns [4], [13].”