Photonic high-frequency capacitance-voltage characterization of interface states in metal-oxide-semiconductor capacitors

By D. M. Kim, Ho-Jung Kim, Hyungtak Kim. 2002

134 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/526be3bb79b573260d3ec822ee5782f165ad3c1a

Citations in the corpus

• Non-Invasive On-Chip Light Observation by Contactless Waveguide Conductivity Monitoring (2014, unknown): “A similar behaviour has been reported also in metal oxide semiconductor (MOS) devices [21] and in high gap conduc-”