Stanford-Binet Intelligence Scales
By R. Kamphaus, J. Juechter. Encyclopedia of Autism Spectrum Disorders, 2010
211 citations recorded by the source corpus.
Originally released in 1905 by Alfred Binet and Theodore Simon, the Binet-Simon Intelligence Scale marked the beginning of a new era in the measurement of intelligence. Initially designed as a diagnostic system primarily for identifying children with mental retardation, the first edition of the Binet-Simon Intelligence Scale included 30 pass-fail items such as word problems, paper cutting, and repeating sentences and digits. The original concepts, such as presenting items of varying levels of difficulty, the use of age-graded norms to predict mental age, and the provision of standardized instructions for administration, set the precedent for the development of future measures of intelligence. Keywords: Stanford-Binet; intelligence scales; CHC theory; Wechsler intelligence tests
Subfields: Applied Psychology, Developmental and Educational Psychology, Experimental and Cognitive Psychology
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