X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene
By H. Yoshida, K. Inaba, N. Sato. 2007
146 citations recorded by the source corpus.
The structure of the thin film phase of pentacene was investigated using x-ray diffraction reciprocal space mapping (RSM). The crystal structure was found to be triclinic with the following lattice parameters: a=0.593nm, b=0.756nm, c=1.565nm, α=98.6°, β=93.3°, and γ=89.8°. Atomic positions were determined by comparing the observed RSM diffraction intensities with theoretical calculations.
Subfields: Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
View Paper: https://www.semanticscholar.org/paper/51efabdad34e5d804ed5eb053e351571d5b9a114
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In Atomic and Molecular Physics, and Optics
In Electronic, Optical and Magnetic Materials
Citations in the corpus
- GIXSGUI: a MATLAB toolbox for grazing‐incidence X‐ray scattering data visualization and reduction, and indexing of buried three‐dimensional periodic nanostructured films (2015, methodology): “This problem can be solved by the technique of reciprocal space mapping (Pereira et al., 2002; Smilgies et al., 2005; Yoshida et al., 2007), which transforms a set of angular scans taken with slightly different offsets into a reconstructed twoor three-dimensional reciprocal space.”