Statistical Edge Detection: Learning and Evaluating Edge Cues

By Scott Konishi, Alan L. Yuille, James M. Coughlan, Song-Chun Zhu. 2003

365 citations recorded by the source corpus.

Subfields: Computer Vision and Pattern Recognition, Industrial and Manufacturing Engineering, Media Technology

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Computer Vision and Pattern Recognition

  1. Luc Van Gool
  2. Alan L. Yuille
  3. Ming-Hsuan Yang
  4. Jitendra Malik
  5. Dacheng Tao
  6. Chunhua Shen
  7. Xiaogang Wang
  8. Bernt Schiele

In Industrial and Manufacturing Engineering

  1. Luc Van Gool
  2. Alan L. Yuille
  3. Kevis-Kokitsi Maninis
  4. Iasonas Kokkinos
  5. Zhuowen Tu
  6. Liang-Chieh Chen
  7. Jordi Pont-Tuset
  8. Pablo Arbeláez

In Media Technology

  1. Xiang Bai
  2. Piotr Doll'ar
  3. Luc Van Gool
  4. Serge J. Belongie
  5. Zhuowen Tu
  6. Pablo Arbeláez
  7. Jordi Pont-Tuset
  8. Iasonas Kokkinos

Citations in the corpus