Band alignment and defect states at SiC/oxide interfaces

By V. Afanas’ev, F. Ciobanu, Sima Dimitrijev, G. Pensl, A. Stesmans. 2004

139 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

View Paper: https://www.semanticscholar.org/paper/51121bde66961966aab82913e6af7684ed1f2ac8