Ultrasonic C-Scan and shearography NDI techniques evaluation of impact defects identification

By R. Růžek, R. Lohonka, Josef Jironč. 2006

137 citations recorded by the source corpus.

Subfields: Computer Vision and Pattern Recognition, Electrical and Electronic Engineering, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/50339eb8cb2afe52cbfd71430517e39785fa4cb3

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Computer Vision and Pattern Recognition

  1. M. Pastor
  2. C. Garnier
  3. F. Eyma
  4. B. Lorrain

In Mechanics of Materials

  1. B. Lorrain

Citations in the corpus