An accelerated life testing model involving performance degradation

By Wenbiao Zhao, ReliaSoft Corporation, E. Elsayed. Reliability and Maintainability Symposium, 2004

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Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model (2008, methodology): “Because it has been empirically shown in Liao and Elsayed [13] (using data collected at predetermined time points in an ADT) that the process in (1) is a reasonable one for describing the degradation of the transformed light intensity of an LED, we will use the following MLEs obtained by Tseng et al”