In situ measurement of lithiation-induced stress in silicon nanoparticles using micro-Raman spectroscopy

By Z. Zeng, Nian Liu, Q. Zeng, S. Lee, W. Mao, Yi Cui. 2016

146 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/4e27b32c6e7fa11f8dd3ba1fe079307340433ce7

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In Atomic and Molecular Physics, and Optics

1. Ju Li
2. Ting Zhu
3. Sulin Zhang

In Electrical and Electronic Engineering

1. Sulin Zhang
2. Ting Zhu
3. K. Zhao
4. Ju Li

Citations in the corpus

• Electrochemomechanical degradation of high-capacity battery electrode materials (2017, methodology): “Several experimental techniques have been adopted to characterize the mechanical properties at different states of charge, including in-situ tensile test of single nanowires [67,68], nanoindentation [69–71], wafer-curvature measurements of thin-film stress [72–75], and Raman microscopy [76].”