The semiconducting properties of passive films formed on AISI 316 L and AISI 321 stainless steels: A test of the point defect model (PDM)

By A. Fattah‐alhosseini, F. Soltani, F. Shirsalimi, B. Ezadi, N. Attarzadeh. 2011

267 citations recorded by the source corpus.

Subfields: Materials Chemistry, Mechanics of Materials, Metals and Alloys

View Paper: https://www.semanticscholar.org/paper/4cde3aba8e3899d42ed766bd06895e4abe1d5ab1