Stability of cerium oxide on silicon studied by x-ray photoelectron spectroscopy

By E. Preisler, O. Marsh, R. A. Beach, T. C. Mcgill. 2001

135 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/4afe03d153a6b63640077272de8d873904c9be10