Ferromagnetic resonance linewidth in metallic thin films: Comparison of measurement methods

By S. Kalarickal, P. Krivošík, Mingzhong Wu, C. Patton, M. Schneider, P. Kabos, T. Silva, J. Nibarger. 2006

553 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

View Paper: https://www.semanticscholar.org/paper/4771513f7fa973c2902bd363170a45778cd36598