Analytical and computational description of effect of grain size on yield stress of metals

By H. Fu, David J. Benson, M. Meyers. 2001

298 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/4733cd0b5c7f498eabfa5d685774cde8f226e1e8

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. S. Walley
2. David L. McDowell

In Materials Chemistry

1. David L. McDowell
2. John D. Clayton
3. S. Walley
4. Sneha N. Naik
5. D. Bammann
6. Dierk Raabe
7. Franz Roters
8. Philip Eisenlohr

Citations in the corpus

• Atomistic based continuum investigation of plastic deformation in nanocrystalline copper (2006, unknown): “In finite element simulations conducted by Fu et al. (2001, 2004) and Schwaiger et al. (2003), the microstructure was modeled as two distinct phases, a grain boundary affected zone (GBAZ), and a grain interior.”
• Modeling Dislocations and Disclinations With Finite Micropolar Elastoplasticity (2006, background): “Meyers and co-workers (Meyers and Ashworth, 1982; Benson et al., 2001; Fu et al., 2001) invoked composite models featuring grain boundary layers of relatively high dislocation density to explain grain size influences on yielding.”