Electron Energy-Loss Spectroscopy

By Ray F. Egerton. Microscopy and Microanalysis, 2002

356 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electrochemistry, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/465ce6a19bfbae1ba27600b1a881aa7c50db4485

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In Electrical and Electronic Engineering

1. F. J. García de Abajo

In Electrochemistry

1. F. J. García de Abajo

In Surfaces, Coatings and Films

1. F. J. García de Abajo

Citations in the corpus

• Optical excitations in electron microscopy (2009, methodology): “˙ ln(q cv=!); (19) is commonly employed to perform Kramers-Kronig (KK) analysis and to retrieve bulk optical constants from measured EELS data after absolute calibration of the loss function Imf 1=g(Egerton, 1996; French et al., 1998; P uger and Fink, 1991; Shiles et al., 1980; Zhang et al., 2008). ”